Electromagnetic Compatibility of Integrated Circuits

Stacey P Jean

Abstract


Abstract—This is a review on assumption of a range of historical work conducted in the area of electromagnetic compatibility of the integrated systems and circuits.

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References


VII. REFERENCES

Wooley, B.A., Pederson, D.O., 1971, A computer-aided evaluation of the 741 amplifier, IEEE Journal of Solid-State Circuits, 6(6): 357– 366

Whalen, J., 1975, The RF Pulse Susceptibility of UHF Transistors,

IEEE Transaction on Electromagnetic Compatibility, 17: 220-225.

Tront, J. G., 1985, Predicting RFI upset of MOSFET digital IC’s,

IEEE Transaction on Electromagnetic Compatibility, 27: 64–69

Lu, D. J, 1982, Watchdog Processor and Structural Integrity Checking, IEEE Transactions on Computers, 31(7): 681-685

Bakoglu, H., 1990, Circuit, Interconnections And Packaging For VLSI, MA: Addison-Wesley, ISBN 0-201-06008-6

Kenneally, D.J., Wilson, D.D., Epshtein, S., 1990, RF upset susceptibilities of CMOS and low power Schottky 4-bit magnitude comparators, IEEE International Symposium on Electromagnetic Compatibility, pp. 671–67

Laurin, J.-J., Zaky, S.G., Balmain, K.G., 1991, EMI-induced failures in crystal oscillators, IEEE Transactions on Electromagnetic Compatibility, 33(4): 334–342

Tang, H.K., 1993, EMI-induced failure in microprocessor-based counting, Microprocessors and Microsystems, 17(4): 248-252

Weston, D. A., Dekker, M., 1991, Electromagnetic Compatibility:

Principles and Applications

Graffi, S., Masetti, G., Golzio, D., 1991, New macromodels and measurements for the analysis of EMI effects in 741 op-amp circuits, IEEE Transactions on Electromagnetic Compatibility, 33(1): 25–34.

Downing, R., Gebler, P., Katopis, G., 1993, Decoupling capacitor effects on switching noise, IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 16(5): 484–489.

Laurin, J.-J., Zaky, S.G., Balmain, K.G., 1995, On the prediction of digital circuit susceptibility to radiated EMI, IEEE Transactions on Electromagnetic Compatibility, 37(4):528–535.

Coulson DR, 1997, EMC-Hardening Microprocessor-based Systems,

IEE Colloquium on Achieving Electromagnetic Compatibility, UK. [14] Hardin, K.B., Fessler, J.T., Bush, D.R., 1994, Spread spectrum clock

generation for the reduction of radiated emissions, IEEE International

Symposium on EMC, pp. 227–231

McCredie, B.D., Becker, W.D., 1996, Modeling, measurement, and simulation of simultaneous switching noise, Part B: Advanced Packaging, IEEE Transactions on Components, Packaging, and Manufacturing Technology, 19(3): 461–472

Slattery, K., Muccioli, J.P., North, T., 1997,. Characterization of the RF emissions from a family of microprocessors using a 1GHz TEM cell, IEEE EMC symposium, Austin

Robinson, M.P., Benson, T.M., Christopoulos, C., Dawson, J.F., Ganley, M.D., Marvin, A.C., Porter, S.J.,. Thomas, D.W.P., and Turner, J.D., 1998, Effect of logic family on radiated emissions from digital circuits, IEEE Transactions on Electromagnetic Compatibility, 40(3): 288-293




DOI: https://doi.org/10.37628/ijmdic.v1i1.58

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